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| Source: | Find a Tender Service (FTS) |
| Buyer: | DIAMOND LIGHT SOURCE LIMITED |
| Main Category: | Goods |
| Procurement Method: | Open procedure |
| Tender Status: | Complete |
| Estimated Value (ex. VAT): | Not specified |
| Release Date: | 29 September 2025 |
| Application Deadline: | — |
| Procurement ID (OCID): | ocds-h6vhtk-058a87 |
| Notice Reference: | 060420-2025 |
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Located on the Harwell Science and Innovation Campus in Oxfordshire, Diamond Light Source (DLS) is a leading-edge facility for science, engineering and innovation. Diamond allows researchers from academia and industry to investigate the structure and behaviour of the world around us at the atomic and molecular level. To continue delivering the world-changing science that Diamond enables, the facility is being upgraded to Diamond-II, a co-ordinated programme of development that combines a major machine upgrade with new instruments and complementary improvements to optics,detectors, sample environment and delivery capabilities, and computing, as well as integrated and correlative methods. This will be transformative in speed and spatial resolution and will offer users streamlined access to enhanced instruments for life and physical sciences. The scope of this contract is to Supply, deliver, install and commission a Fizeau laser interferometer, subject to the performance specification. The specification details the requirements for a Fizeau interferometer to accurately measure the surface quality of Xray optics for Diamond's beamlines in the Optics Metrology Lab (OML). The Optics & Metrology group at Diamond requires a Fizeau interferometer with a ~ 150 mm diameter exit laser beam to measure the slope and figure error of synchrotron X-ray mirrors and crystals. Such optics are manufactured from single-crystal silicon, often with a metallic coating to enhance X-ray reflectivity. Advances in optical production technology, including ion beam figuring and elastic emission machining, mean that it is now possible to produce X-ray optics with figure errors less than 1 nm rms. To accurately characterise such optics, a measurement tool is required with an accuracy and repeatability.
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