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| Source: | Find a Tender Service (FTS) |
| Notice Type: | Award notice |
| Buyer: | DE MONTFORT UNIVERSITY |
| Main Category: | Goods |
| Procurement Method: | Below threshold - without competition |
| Tender Status: | Complete |
| Estimated Value (ex. VAT): | Not specified |
| Release Date: | 4 April 2025 |
| Application Deadline: | — |
| Procurement ID (OCID): | ocds-h6vhtk-04fd58 |
| Notice Reference: | 013089-2025 |
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The Atomic force microscope (AFM) is a versatile tool to investigate the properties of surfaces such as: their topography, roughness and grain size/shape. It would be used for UG/PG lab experiments as well as for PhD students/research.
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